{"id":287,"date":"2011-05-24T16:32:10","date_gmt":"2011-05-24T14:32:10","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/nanoscale-approach-electrical-properties-mos-memory-devices-si-nanocrystals\/"},"modified":"2011-05-24T16:32:10","modified_gmt":"2011-05-24T14:32:10","slug":"nanoscale-approach-electrical-properties-mos-memory-devices-si-nanocrystals","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/nanoscale-approach-electrical-properties-mos-memory-devices-si-nanocrystals\/","title":{"rendered":"A nanoscale approach to the electrical properties of MOS memory devices with Si-nanocrystals"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-287","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/287","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=287"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}