{"id":300,"date":"2011-05-24T16:52:30","date_gmt":"2011-05-24T14:52:30","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/ultra-thin-films-atomic-force-microscopy-grown-sio2-gate-oxide-mos-structures-conduction-and\/"},"modified":"2011-05-24T16:52:30","modified_gmt":"2011-05-24T14:52:30","slug":"ultra-thin-films-atomic-force-microscopy-grown-sio2-gate-oxide-mos-structures-conduction-and","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/ultra-thin-films-atomic-force-microscopy-grown-sio2-gate-oxide-mos-structures-conduction-and\/","title":{"rendered":"Ultra Thin Films of Atomic Force Microscopy Grown SiO2 as Gate Oxide on MOS Structures: Conduction and Breakdown Behavior"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-300","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/300","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=300"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}