{"id":301,"date":"2011-05-24T16:53:38","date_gmt":"2011-05-24T14:53:38","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/atomic-force-microscope-topographical-artifacts-after-dielectric-breakdown-ultrathin-sio2-fi\/"},"modified":"2011-05-24T16:53:38","modified_gmt":"2011-05-24T14:53:38","slug":"atomic-force-microscope-topographical-artifacts-after-dielectric-breakdown-ultrathin-sio2-fi","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/atomic-force-microscope-topographical-artifacts-after-dielectric-breakdown-ultrathin-sio2-fi\/","title":{"rendered":"Atomic Force Microscope topographical artifacts after the dielectric breakdown of ultrathin SiO2 films"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-301","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/301","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=301"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}