{"id":325,"date":"2011-05-25T09:54:49","date_gmt":"2011-05-25T07:54:49","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/monitoring-degradation-causes-breakdown-ultrathin-5nm-sio2-gate-oxides\/"},"modified":"2011-05-25T09:54:49","modified_gmt":"2011-05-25T07:54:49","slug":"monitoring-degradation-causes-breakdown-ultrathin-5nm-sio2-gate-oxides","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/monitoring-degradation-causes-breakdown-ultrathin-5nm-sio2-gate-oxides\/","title":{"rendered":"Monitoring the degradation that causes the breakdown of ultrathin (<5nm) SiO2 gate oxides"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-325","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/325","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=325"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}