{"id":356,"date":"2011-10-24T13:30:01","date_gmt":"2011-10-24T11:30:01","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/combined-nanoscale-and-device-level-degradation-analysis-sio2-layers-mos-nonvolatile-memory\/"},"modified":"2011-10-24T13:30:01","modified_gmt":"2011-10-24T11:30:01","slug":"combined-nanoscale-and-device-level-degradation-analysis-sio2-layers-mos-nonvolatile-memory","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/combined-nanoscale-and-device-level-degradation-analysis-sio2-layers-mos-nonvolatile-memory\/","title":{"rendered":"Combined Nanoscale and Device-Level degradation analysis of SiO2 layers of MOS Nonvolatile Memory Devices"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-356","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/356","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=356"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}