{"id":371,"date":"2014-01-10T15:22:28","date_gmt":"2014-01-10T13:22:28","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/memfet-gate-dielectric-breakdown-system-reconfigurability\/"},"modified":"2014-01-10T15:22:28","modified_gmt":"2014-01-10T13:22:28","slug":"memfet-gate-dielectric-breakdown-system-reconfigurability","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/memfet-gate-dielectric-breakdown-system-reconfigurability\/","title":{"rendered":"memFET: From gate Dielectric Breakdown to system reconfigurability"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-371","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/371","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=371"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}