{"id":373,"date":"2014-01-10T15:55:03","date_gmt":"2014-01-10T13:55:03","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/dielectric-breakdown-ultra-thin-hf-based-gate-stacks-resistive-switching-phenomenon\/"},"modified":"2014-01-10T15:55:03","modified_gmt":"2014-01-10T13:55:03","slug":"dielectric-breakdown-ultra-thin-hf-based-gate-stacks-resistive-switching-phenomenon","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/dielectric-breakdown-ultra-thin-hf-based-gate-stacks-resistive-switching-phenomenon\/","title":{"rendered":"Dielectric Breakdown in ultra-thin Hf based gate stacks: A resistive Switching Phenomenon"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-373","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/373","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=373"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}