{"id":393,"date":"2014-01-13T17:59:14","date_gmt":"2014-01-13T15:59:14","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/resistive-switching-behavior-dielectric-breakdown-ultra-thin-hf-based-gate-stacks-mosfets\/"},"modified":"2014-01-13T17:59:14","modified_gmt":"2014-01-13T15:59:14","slug":"resistive-switching-behavior-dielectric-breakdown-ultra-thin-hf-based-gate-stacks-mosfets","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/resistive-switching-behavior-dielectric-breakdown-ultra-thin-hf-based-gate-stacks-mosfets\/","title":{"rendered":"Resistive switching-like behavior of the dielectric breakdown in ultra-thin Hf based gate stacks in MOSFETs"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-393","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/393","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=393"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}