{"id":411,"date":"2015-07-16T17:47:06","date_gmt":"2015-07-16T15:47:06","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/negative-bias-temperature-instabilities-induced-device-millisecond-anneal-ultra-shallow\/"},"modified":"2015-07-16T17:47:06","modified_gmt":"2015-07-16T15:47:06","slug":"negative-bias-temperature-instabilities-induced-device-millisecond-anneal-ultra-shallow","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/negative-bias-temperature-instabilities-induced-device-millisecond-anneal-ultra-shallow\/","title":{"rendered":"Negative Bias Temperature Instabilities induced in device with millisecond anneal for ultra-shallow junctions"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-411","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/411","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=411"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}