{"id":448,"date":"2017-09-05T13:18:17","date_gmt":"2017-09-05T11:18:17","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/biblio\/ni-hfo2-si-resistive-switching-structures-a-device-level-and-nanoscale-analysis-with-cafm\/"},"modified":"2017-09-05T13:18:17","modified_gmt":"2017-09-05T11:18:17","slug":"ni-hfo2-si-resistive-switching-structures-a-device-level-and-nanoscale-analysis-with-cafm","status":"publish","type":"biblio","link":"https:\/\/webs.uab.cat\/redec\/biblio\/ni-hfo2-si-resistive-switching-structures-a-device-level-and-nanoscale-analysis-with-cafm\/","title":{"rendered":"Ni\/HfO2\/Si Resistive Switching structures: A device level and nanoscale analysis with CAFM"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":20,"featured_media":0,"template":"","class_list":["post-448","biblio","type-biblio","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio\/448","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/biblio"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/biblio"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=448"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}