{"id":155,"date":"2009-05-25T13:07:54","date_gmt":"2009-05-25T11:07:54","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/noticies\/"},"modified":"2025-05-20T19:11:06","modified_gmt":"2025-05-20T17:11:06","slug":"noticies","status":"publish","type":"page","link":"https:\/\/webs.uab.cat\/redec\/","title":{"rendered":"Inici"},"content":{"rendered":"\n<figure class=\"wp-block-video\"><video height=\"480\" style=\"aspect-ratio: 852 \/ 480;\" width=\"852\" controls src=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2025\/05\/REDEC_short14.mp4\"><\/video><\/figure>\n\n\n\n<p>El Grup de Fiabilitat de Dispositius i Circuits Electr\u00f2nics (REDEC) forma part del Departament d&#8217;Enginyeria Electr\u00f2nica (<a href=\"http:\/\/www.uab.es\/departament\/enginyeria-electronica\/\">DEE<\/a>) de la Universitat&nbsp;Aut\u00f2noma de Barcelona (<a href=\"http:\/\/www.uab.es\/\">UAB<\/a>). La seva recerca es focalitza en els dispositius i circuits propis de tecnologies CMOS micro i nanoelectr\u00f2niques.<\/p>\n\n\n\n<p>&nbsp;&#8211; Sinano Institute<\/p>\n\n\n\n<p>&nbsp;&#8211; Nanovar<\/p>\n\n\n\n<p><strong>REDEC&nbsp;<\/strong>est\u00e0 ubicat a l&#8217;Escola d&#8217;Enginyeria (<a href=\"http:\/\/www.uab.es\/escola-enginyeria\/\">EE<\/a>), situada al <a href=\"http:\/\/www.uab.es\/servlet\/Satellite\/coneix-la-uab\/planols-i-transports\/planols\/campus-de-bellaterra\/planol-del-campus-de-bellaterra-1096476529693.html\">Campus de Bellaterra de la UAB<\/a> i \u00e9s responsable d&#8217;impartir doc\u00e8ncia de l&#8217;\u00e0rea d\u2019Electr\u00f2nica en diferents titulacions (Enginyeria Electr\u00f2nica, Enginyeria Inform\u00e0tica, Enginyeria T\u00e8cnica de Telecomunicaci\u00f3&#8230;), aix\u00ed com en el M\u00e0ster en Enginyeria Micro i Nanoelectr\u00f2nica.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"500\" height=\"333\" src=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image.png\" alt=\"\" class=\"wp-image-1102\" style=\"aspect-ratio:1.5041666666666667;width:507px;height:auto\" srcset=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image.png 500w, https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-300x200.png 300w\" sizes=\"auto, (max-width: 500px) 100vw, 500px\" \/><\/figure>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"500\" height=\"333\" src=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-1.png\" alt=\"\" class=\"wp-image-1105\" style=\"aspect-ratio:1.4979253112033195;width:505px;height:auto\" srcset=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-1.png 500w, https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-1-300x200.png 300w\" sizes=\"auto, (max-width: 500px) 100vw, 500px\" \/><\/figure>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"500\" height=\"333\" src=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-3.png\" alt=\"\" class=\"wp-image-1111\" style=\"aspect-ratio:1.5020746887966805;width:505px;height:auto\" srcset=\"https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-3.png 500w, https:\/\/webs.uab.cat\/redec\/wp-content\/uploads\/sites\/260\/2023\/07\/image-3-300x200.png 300w\" sizes=\"auto, (max-width: 500px) 100vw, 500px\" \/><\/figure>\n","protected":false},"excerpt":{"rendered":"<p>El Grup de Fiabilitat de Dispositius i Circuits Electr\u00f2nics (REDEC) forma part del Departament d&#8217;Enginyeria Electr\u00f2nica (DEE) de la Universitat&nbsp;Aut\u00f2noma de Barcelona (UAB). La seva recerca es focalitza en els dispositius i circuits propis de tecnologies CMOS micro i nanoelectr\u00f2niques. &nbsp;&#8211; Sinano Institute &nbsp;&#8211; Nanovar REDEC&nbsp;est\u00e0 ubicat a l&#8217;Escola d&#8217;Enginyeria (EE), situada al Campus de [&hellip;]<\/p>\n","protected":false},"author":20,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-155","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages\/155","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"replies":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/comments?post=155"}],"version-history":[{"count":7,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages\/155\/revisions"}],"predecessor-version":[{"id":1220,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages\/155\/revisions\/1220"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=155"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}