{"id":197,"date":"2011-05-13T12:59:08","date_gmt":"2011-05-13T10:59:08","guid":{"rendered":"https:\/\/webs.uab.cat\/redec\/equipaments\/"},"modified":"2011-05-13T12:59:08","modified_gmt":"2011-05-13T10:59:08","slug":"equipaments","status":"publish","type":"page","link":"https:\/\/webs.uab.cat\/redec\/equipaments\/","title":{"rendered":"Equipaments"},"content":{"rendered":"

REDEC<\/strong> disposa de dos laboratoris totalment equipats per la caracterizaci\u00f3 de dispositius i circuits a nivel macrosc\u00f2pic i nanosc\u00f2pic.<\/p>\n\n\n\n\n
\n

Laboratori de Caracterizaci\u00f3 Macrosc\u00f2pica<\/strong><\/span><\/span><\/p>\n

Equipament:<\/strong><\/span><\/span><\/p>\n

    \n
  • 4284A Precision LCR Meter<\/span><\/li>\n
  • 4156C Precision Semiconductor Parameter Analyzer<\/span><\/li>\n
  • 4155 Precision Semiconductor Parameter Analyzer<\/span><\/li>\n
  • K4200 Semiconductor Characterization System amb PGU<\/span><\/li>\n
  • E5250A Low Leakage switch Mainframe<\/span><\/li>\n
  • 81101A Pulse Generator<\/span><\/li>\n
  • 2431L Oscilloscope<\/span><\/li>\n
  • Software Metrics Agilent I\/CV<\/span><\/li>\n
  • SUN Blade 1500<\/span><\/li>\n
  • T-CAD Synopsis software<\/span><\/li>\n
  • PCI-GPIB Board<\/span><\/li>\n
  • HC100 Plotter<\/span><\/li>\n
  • 2 Caixes de Faraday<\/span><\/li>\n
  • Manual Station Probe Wentworth<\/span><\/li>\n
  • Semi-Automatic Station Probe Cascade REL-6100<\/span><\/li>\n
  • TP03010B Termochuck<\/span><\/li>\n
  • APC SAI 2200<\/span><\/li>\n<\/ul>\n

    Aquest equipament \u00e9s utilitzat per l’estudi de l’impacte dels diferents mecanismes de fallada relacionats amb l’\u00f2xid de porta de dispositius MOS (degradaci\u00f3 i ruptura diel\u00e8ctrica, Negative Bias Temperature Instability, channel hot carrier degradation) en el funcionament dels dispositius i circuits electr\u00f2nics.<\/span><\/p>\n

     <\/span><\/p>\n<\/td>\n

\"\"<\/a><\/span><\/td>\n<\/tr>\n
\n

Laboratori de Caracterizaci\u00f3 Nanosc\u00f2pica<\/strong><\/span><\/p>\n

Equipament:<\/strong><\/span><\/p>\n

    \n
  • 4145 Semiconductor Parameter Analyzer<\/li>\n
  • TDS 220 Oscilloscope<\/li>\n
  • Low noise preamplifier FEMTO<\/li>\n
  • Faraday Box<\/li>\n
  • C-AFM (Conductive Atomic Force Microscope) de Nanotec<\/li>\n
  • C-AFM amb ambient controlat de Scientec<\/li>\n
  • ECAFM (Enhaced Conductive Atomic Force Microscope)<\/li>\n
  • AFG5501 Arbitrari Function Generator<\/li>\n
  • TK-C1380 Video Camara<\/li>\n
  • 2636 System Sourcemeter<\/li>\n<\/ul>\n

    Aquest equipament \u00e9s utilitzat per caracteritzar el\u00e8ctricament i avaluar la fiabilitat dels dispositius electr\u00f2nics a escala nanom\u00e8trica.<\/p>\n<\/td>\n

\"\"<\/a><\/span><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

 <\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

REDEC disposa de dos laboratoris totalment equipats per la caracterizaci\u00f3 de dispositius i circuits a nivel macrosc\u00f2pic i nanosc\u00f2pic. Laboratori de Caracterizaci\u00f3 Macrosc\u00f2pica Equipament: 4284A Precision LCR Meter 4156C Precision Semiconductor Parameter Analyzer 4155 Precision Semiconductor Parameter Analyzer K4200 Semiconductor Characterization System amb PGU E5250A Low Leakage switch Mainframe 81101A Pulse Generator 2431L Oscilloscope Software […]<\/p>\n","protected":false},"author":20,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-197","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages\/197","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/users\/20"}],"replies":[{"embeddable":true,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/comments?post=197"}],"version-history":[{"count":0,"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/pages\/197\/revisions"}],"wp:attachment":[{"href":"https:\/\/webs.uab.cat\/redec\/wp-json\/wp\/v2\/media?parent=197"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}