Authors L. Aguilera, X. Aymerich, M. Nafría, M. Porti, A. Bayerl, i M.Lanza Citation Key 170 COinS Data Date Published 2009 Pagination 360-363 Journal Journal Vacuum Science and Technology B Volume 27(1) Year of Publication 2009 ← Peculiar characteristics of nanocrystal memory cells programming window → Comparison of standard macroscopic and conductive atomic force microscopy leakage measurements on gate removed high-k capacitors