Authors J. Boix, X. Aymerich, M. Nafría, R. Rodríguez, i J. Martín-Martínez Citation Key 184 COinS Data Date Published 2008 Journal Proc. European Solid State Devices and Research Conference Start Page 16 Year of Publication 2008 ← Stochastic Piecewise modeling of post-BD gate current oriented to circuit design → CAFM nanoscale electrical characterization of gate stacks for advance MOS devices