Authors R. Fernández, X. Aymerich, M.Nafría, i R. Rodríguez Citation Key 208 COinS Data Date Published 2007 Pagination 31-36 Journal Microelectronics Engineering Volume 84/1 Year of Publication 2007 ← Using AFM related techniques for the nanoscale electrical characterization of irradiated ultra-thin gate oxides → Effect of oxide breakdown on RS latches