Trapped charge distributions in thin (10nm) SiO2 films subjected to static and dynamic stresses

Authors

R. Rodríguez, X. Aymerich, J. Suñé, i M. Nafría

Citation Key

273

COinS Data

Date Published

1998

Issue

4

Pagination

881-888

Journal

IEEE Transactions on Electron Devices

Volume

45

Year of Publication

1998