Accession Number
11931299
Authors
A. Crespo-Yepes, X. Aymerich, M. Nafría, R. Rodríguez, i J. Martín-Martínez
Citation Key
318
COinS Data

Date Published
FEB 2011
DOI
10.1109/SCED.2011.5744217
ISBN Number
978-1-4244-7863-7
Keywords
CMOS devices, Dielectric Breakdown, high-k, reliability, resistive switching
Conference Location
Palma de Mallorca
Conference Name
Spanish Conference on Electron Devices (CDE), 2011
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5744217
Year of Publication
2011