Authors
Fei Hui, M. Lanza, Huiling Duan, M. Nafría, i M. Porti
Citation Key
389
COinS Data

Date Published
Feb 2015
DOI
10.1109/CDE.2015.7087444
ISBN Number
15060327
Keywords
AFM EDX SPM electrical properties X-ray microscope graphene MEMS graphene-coated tips intrinsic atomic force microscope tips microelectromechanical system microscope scanning probe microscopes topographic
Conference Location
Madrid
Publisher
IEEE
Conference Name
Electron Device Spanish Conference (CDE)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087444&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2015