Authors
J. Martín-Martínez, A Rubio, F. V. Fernández, E. Roca, X. Aymerich, M. Nafría, R. Rodríguez, i J. Díaz
Citation Key
396
COinS Data

Date Published
Oct 2014
DOI
10.1109/VARI.2014.6957088
ISBN Number
14772731
Keywords
amplifiers, characterization, device drain current, Integrated circuit reliability, MOSFET, parameter extraction, pMOS transistors, random noise, random telegraph noise, reliability, SRAM chips, SRAM sense amplifiers, voltage sense amplifiers
Conference Location
Palma de Mallorca
Publisher
IEEE
Conference Name
European Workshop on CMOS Variability (VARI)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6957088&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2014