Accession Number
WOS:000355011700036
Authors
C. Couso, X. Aymerich, M. Nafría, V. Iglesias, J. Martín-Martínez, i M. Porti
Citation Key
400
COinS Data

Date Published
MAY 2015
DOI
10.1116/1.4915328
ISSN
1071-1023
Keywords
AFM, C-AFM, ELECTRICAL-PROPERTIES, High-K dielectrics, microscopy, polycristalline, simulator, topography, tunneling current
Journal
Journal of Vacuum Science & Technology B
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=T2RNqQwde7r4jL3OUYv&page=1&doc=2
Volume
33
Year of Publication
2015