Accession Number
WOS:000329222700009
Authors
J. Martín-Martínez, X. Aymerich, M. Nafría, R. Rodríguez, i M. Moras
Citation Key
406
COinS Data

Date Published
JAN 2014
DOI
10.1007/s10470-013-0226-4
ISBN Number
1573-1979
ISSN
0925-1030
Keywords
aging, bias temperature instability, CMOS, Dielectric Breakdown, GATE OXIDE, model, RELAB, reliability, SPICE, STATISTICS, tool simulation, variability, WEAR-OUT
Issue
1
Pagination
65-76
Journal
ANALOG INTEGRATED CIRCUITS AND SIGNALS PROCESSING
Start Page
65
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2MgRVtjG5XTWRwBNXJ&page=2&doc=12
Volume
78
Year of Publication
2014