Accession Number
WOS:000321229200037
Authors
V. Iglesias, G. Bersuker, L. Frey, A. J. Bauer, K. Murakami, M. Rommel, T. Erlbacher, X. Aymerich, M. Nafría, R. Rodríguez, M. Porti, i J. Martín-Martínez
Citation Key
409
COinS Data

Date Published
SEP 2013
DOI
10.1016/j.mee.2013.03.022
ISSN
0167-9317
Keywords
Bimodal Weibull distributions, conductive atomic force microscopy, Dielectric Breakdown, Grain boundaries, high-k
Pagination
129-132
Journal
Microelectronics Reliability
Start Page
129
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2MgRVtjG5XTWRwBNXJ&page=2&doc=16
Volume
109
Year of Publication
2013