Authors E. Amat, G. Groeseneken, X. Aymerich, M. Nafría, R. Rodríguez, R. Degraeve, i T. Kauerauf Citation Key 156 COinS Data Date Published 2010 Pagination 47-50 Journal Microelectronic Engineering Volume 87(1) Year of Publication 2010 ← Correlation between the nanoscale electrical and morphological properties of crystallized hafnium oxide-based metal oxide semiconductor structures → Simulation of the hot-carrier degradation in short channel transitors with high-k dielectric