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- Accession Number
- 10545622
- Authors
- J. Martín-Martínez, G. Groeseneken, B. Dierickx, P. Zuber, X. Aymerich, M. Nafría, R. Rodríguez, N. Ayala, J. Boix, i B. Kaczer
- Citation Key
- 357
- COinS Data
- DOI
- 10.1109/SCED.2009.4800454
- ISBN Number
- 978-1-4244-2838-0
- ISBN
- 978-1-4244-2839-7
- Keywords
- bias temperature instability, capacitors, circuit simulation, circuit-design oriented modelling, inverters, mirror, MOSFET aging, MOSFET circuits, post-BD gate currents, reliability, semiconductor device relibaility, stress, temperature dependence, thresh
- Pagination
- 156-159
- Conference Location
- Santiago de Compostela
- Conference Name
- 2009 Spanish Conference on Electron Devices
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4800454
- Year of Conference
- 2009