Accession Number
12571581
Authors
J. Martín-Martínez, G. Groeseneken, B. Dierickx, X. Aymerich, M. Nafría, R. Rodríguez, P. J. Roussel, R. Degraeve, i B. Kaczer
Citation Key
362
COinS Data

Date Published
March 2012
DOI
10.1109/TDMR.2011.2162238
ISSN
1530-4388
Keywords
BD mechanisms, circuit design-oriented stochastic piecewise modeling, circuit simulation tools, CMOS, device geometries, device level characterization, Dielectric Breakdown, integrated circuit modeling, logic gates, model parameter extraction, MOSFET, MOS
Issue
1
Pagination
78-85
Journal
IEEE Transactions on Device and Materials Reliability
Start Page
78
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5955107&sortType%3Ddesc_p_Publication_Year%26queryText%3DMartin-Martinez
Volume
12
Year of Publication
2012