Vés al contingut
- Authors
- M. Lanza, M. Fasoli, A. Vedda, G. Ghinidi, A. Sebastiani, X. Aymerich, M. Nafría, i M. Porti
- Citation Key
- 307
- COinS Data
- Date Published
- DEC 2009
- DOI
- 10.1109/TDMR.2009.2027228
- ISBN Number
- 526UW
- ISSN
- 1530-4388
- Keywords
- Atomic force microscopy (AFM); luminescence; MOS memory integrated circuits
- Issue
- 4
- Pagination
- 529-536
- Journal
- IEEE Transactions on Device and Materials Reliability
- Start Page
- 529
- Type of Article
- Article; Proceedings Paper
- URL
- http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5165000
- Volume
- 9
- Year of Publication
- 2009