Accession Number
WOS:000314672300026
Authors
E. Amat, G. Groeseneken, R. Degraeve, X. Aymerich, M. Nafría, R. Rodríguez, i T. Kauerauf
Citation Key
414
COinS Data

Date Published
MAR 2013
DOI
10.1016/j.mee.2012.10.011
ISSN
0167-9317
Keywords
BTI, CMOS, ENERGY, GATE STACKS, high-k, Hot-carriers, MECHANISMS, reliability, stress, transistors
Pagination
144-149
Journal
Microelectronics Reliability
Start Page
144
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=R2MgRVtjG5XTWRwBNXJ&page=3&doc=22
Volume
103
Year of Publication
2013