Accession Number
15937872
Authors
C. Couso, G. Bersuker, A. Cordes, N. Domingo, M. Nafría, S. Claramunt, M. Porti, i V. Iglesias
Citation Key
420
COinS Data

Date Published
March 2016
DOI
10.1109/LED.2016.2537051
ISSN
0741-3106
Keywords
III-V semiconductors; Poole-Frenkel effect; AFM; dislocations; elemental semiconductors; temperature measurement; thermionic emission; Surface topography; Temperature distribution
Issue
5
Pagination
640-643
Publisher
IEEE
Journal
IEEE Electron Device Letters
Start Page
640
Type of Article
Paper
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7422696&queryText=C.%20Couso&sortType=desc_p_Publication_Year
Volume
37
Year of Publication
2016