Vés al contingut
- Authors
- H. Amrouch, X. Aymerich, M. Nafría, R. Rodríguez, M. Moras, V. M. van Santen, i J. Martín-Martínez
- Citation Key
- 394
- COinS Data
- Date Published
- April 2015
- DOI
- 10.1109/IRPS.2015.7112711
- ISBN Number
- 15180453
- Keywords
- aging, aging phenomena, bias temperature instability, BTI, complex physical-based model, estimaation theory, MOSFET, NBTI, on-chip system, reliability estimation, scaling, semiconductor device reliability, stress, TDDB, temperature dependece, time depende
- Conference Location
- Monterey, CA
- Publisher
- IEEE
- Conference Name
- International Reliability Physics Symposium (IRPS)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112711&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Year of Publication
- 2015