Authors E. Miranda, X. Aymerich, M. Nafría, R. Rodríguez, i J. Suñé Citation Key 268 COinS Data Date Published 1999 Pagination 1801-1805 Journal Solid State Electronics Volume 43 Year of Publication 1999 ← A function-fit model for the soft-breakdown failure mode → A common framework for soft and hard breakdown in ultrathin gate oxides based on the theory of point contact conduction