Electrical characterization at a nanometer scale of weak spots in irradiated SiO2 gate oxides

Authors

M. Porti, S. Cimino, A. Paccagnella, A. Cester, X. Aymerich, i M. Nafría

Citation Key

226

COinS Data

Date Published

2005

Issue

Part 2

Pagination

1457–1461

Journal

IEEE Transactions on Nuclear Science

Volume

52 (5)

Year of Publication

2005