Authors J. Martín-Martínez, G. Groeseneken, B. Kaczer, X. Aymerich, M. Nafría, i R.Rodríguez Citation Key 182 COinS Data Date Published 2008 Pagination 55-58 Journal Proc. European Solid State Devices and Research Conference Year of Publication 2008 ← Channel Hot-Carrier degradation under static stress in short channel transistors with high-k/metal gate stacks → Stochastic Piecewise modeling of post-BD gate current oriented to circuit design