Vés al contingut
- Authors
- Fei Hui, M. Lanza, Huiling Duan, M. Nafría, i M. Porti
- Citation Key
- 389
- COinS Data
- Date Published
- Feb 2015
- DOI
- 10.1109/CDE.2015.7087444
- ISBN Number
- 15060327
- Keywords
- AFM EDX SPM electrical properties X-ray microscope graphene MEMS graphene-coated tips intrinsic atomic force microscope tips microelectromechanical system microscope scanning probe microscopes topographic
- Conference Location
- Madrid
- Publisher
- IEEE
- Conference Name
- Electron Device Spanish Conference (CDE)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087444&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Year of Publication
- 2015