Accession Number
11626346
Authors
G. Bersuker, R. Jammy, P. Kirsch, A. Shluger, K. McKenna, M. Nafría, M. Porti, V. Iglesias, i J. Yum
Citation Key
376
COinS Data

Date Published
September 2010
DOI
10.1109/ESSDERC.2010.5618225
ISBN Number
978-1-4244-6658-0
Keywords
Atomic force microscopy, conductive AFM measurements, constant voltage stress, currents measurements, dielectric devices, dielectric measuresments, dielectrics, electrical measurements, electron traps, Grain boundaries, grain boundaries-driven leakage pat
Pagination
333-336
Conference Location
Sevilla, Spain
Conference Name
2010 Proceedings of the European Solid-State Device Research Conference (ESSDERC)
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5618225
Year of Conference
2010