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- Authors
- A. Crespo-Yepes, F. Campabadal, M B González, X. Aymerich, M. Nafría, R. Rodríguez, M. Maestro, I. Rama, i J. Martín-Martínez
- Citation Key
- 416
- COinS Data
- Date Published
- January 2016
- DOI
- 10.1109/ULIS.2016.7440058
- ISBN Number
- 15886476
- Keywords
- Analytical models, circuit-based model, computational modeling, electrical models, fitting, integrated circuit modeling, inter device variability, model parameter distributions, nonvolatile memories, resistive RAM, Resistive Switching devices, RS array an
- Conference Location
- Vienna, Austria
- Publisher
- IEEE
- Conference Name
- EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7440058&queryText=crespo-yepes&sortType=desc_p_Publication_Year
- Year of Publication
- 2016