Vés al contingut
- Authors
- G. Bersuker, M. Nafría, M. Porti, V. Iglesias, A. Shluger, K. McKenna, L. Larcher, A. Padovani, L. Vandelli, P. Kirsch, D. Veksler, i D. C. Gilmer
- Citation Key
- 375
- COinS Data
- Date Published
- Dicember 2011
- DOI
- 10.1063/1.3671565
- ISSN
- 0021-8979
- Keywords
- AFM, Atomic force microscopy, electric Breakdown, electrical resistivity, grain boundary segregation, Hafnium compounds, leakage currents, oxidation, phonon-phonon interactions, random-acces storage, reliability, stress, titanium compounds, tunnelling, va
- Issue
- 12
- Pagination
- 124518 - 124518-12
- Journal
- Journal of Applied Physics
- Start Page
- 124518
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6119174&sortType%3Ddesc_p_Publication_Year%26pageNumber%3D2%26queryText%3DV.+Iglesias
- Volume
- 110
- Year of Publication
- 2011