Authors J. Suñé, X. Aymerich, M. Nafría, i E. Miranda Citation Key 264 COinS Data Date Published 1999 Issue 7 Pagination 959-961 Journal Applied Physics Letters Volume 75 Year of Publication 1999 ← Analysis of the degradation and breakdown of thin SiO2 films under static and dynamic tests using a two-step stress procedure → Switching events in the soft breakdown I-t characteristic of ultra-thin SiO2 layers