Accession Number
10800080
Authors
B. Kaczer, G. Groeseneken, P. J. Roussel, M. Aoulaiche, E. Simoen, J. Martín-Martínez, i T. Grasser
Citation Key
369
COinS Data

DOI
10.1109/IRPS.2009.5173224
ISBN Number
978-1-4244-2888-5
ISBN
978-1-4244-2889-2
Keywords
CMOS technology, defect states, inverters, monitoring, NBTI relaxation, negative bias tempertaure instability, Noibium compunds, noiose measurement, noise, pFET reliability, poisson defect number statistics, poisson distribution, relaxation, reliability,
Pagination
55-60
Conference Location
Montreal, Quebec, Canada
Conference Name
2009 IEEE International Reliability Physics Symposium
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5173224
Year of Conference
2009