Authors
N. Ayala, X. Aymerich, M. Nafría, R. Rodríguez, P. Verheyen, M B González, E. Amat, i J. Martín-Martínez
Citation Key
304
COinS Data

Date Published
JUL 2011
DOI
10.1016/j.mee.2011.03.093
ISBN Number
790FA
ISSN
0167-9317
Keywords
CMOS; Reliability; Variability; NBTI; SPICE; Modelling
Issue
7
Pagination
1384-1387
Journal
Microelectronic Engineering
Start Page
1384
Type of Article
Article; Proceedings Paper
URL
http://www.sciencedirect.com/science/article/pii/S0167931711003522
Volume
88
Year of Publication
2011