Vés al contingut
- Authors
- N. Ayala, X. Aymerich, M. Nafría, R. Rodríguez, P. Verheyen, M B González, E. Amat, i J. Martín-Martínez
- Citation Key
- 304
- COinS Data
- Date Published
- JUL 2011
- DOI
- 10.1016/j.mee.2011.03.093
- ISBN Number
- 790FA
- ISSN
- 0167-9317
- Keywords
- CMOS; Reliability; Variability; NBTI; SPICE; Modelling
- Issue
- 7
- Pagination
- 1384-1387
- Journal
- Microelectronic Engineering
- Start Page
- 1384
- Type of Article
- Article; Proceedings Paper
- URL
- http://www.sciencedirect.com/science/article/pii/S0167931711003522
- Volume
- 88
- Year of Publication
- 2011