Accession Number
WOS:000343838200023
Authors
M. Moras, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, i J. Martín-Martínez
Citation Key
403
COinS Data

Date Published
NOV 2014
DOI
10.1016/j.sse.2014.06.036
ISBN Number
1879-2405
ISSN
0038-1101
Keywords
Annealing, BTI, Defect passivation, Emission and capture times, MOSFET, Time-dependent variability
Pagination
131-136
Journal
SOLID-STATES ELECTRONICS
Start Page
131
Type of Article
Article
URL
http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=2&SID=T2RNqQwde7r4jL3OUYv&page=1&doc=5
Volume
101
Year of Publication
2014