Vés al contingut
- Authors
- M. Moras, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, V. Velayudhan, i J. Martín-Martínez
- Citation Key
- 388
- COinS Data
- Date Published
- Feb 2015
- DOI
- 10.1109/CDE.2015.7087507
- ISBN Number
- 15060347
- Keywords
- MOSFET negative bias temperature instability semiconductor device models circuits Reliability SPICE probabilistic defect occupancy ultrafast characterization Aging NBTI Reliability
- Pagination
- 1-4
- Conference Location
- Madrid
- Publisher
- IEEE
- Conference Name
- Electron Device Spanish Conference (CDE)
- URL
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087507&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
- Year of Publication
- 2015