Authors
M. Moras, E. Simoen, X. Aymerich, M. Nafría, R. Rodríguez, V. Velayudhan, i J. Martín-Martínez
Citation Key
388
COinS Data

Date Published
Feb 2015
DOI
10.1109/CDE.2015.7087507
ISBN Number
15060347
Keywords
MOSFET negative bias temperature instability semiconductor device models circuits Reliability SPICE probabilistic defect occupancy ultrafast characterization Aging NBTI Reliability
Pagination
1-4
Conference Location
Madrid
Publisher
IEEE
Conference Name
Electron Device Spanish Conference (CDE)
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087507&queryText=nafria&sortType=desc_p_Publication_Year&searchField=Search_All
Year of Publication
2015