Authors A. Gasperin, A. Paccagnella, M.Nafría, M. Porti, J. Martín-Martínez, i E. Amat Citation Key 169 COinS Data Date Published 2009 Pagination 512-516 Journal Journal Vacuum Science and Technology B Volume 27(1) Year of Publication 2009 ← Reversible dielectric breakdown in ultra Hf based high-k stacks under current limited stresses → Development of a Conductive Atomic Force Microscope with a logarithmic current-to-voltage converter for the study of MOS gate dielectrics reliability