Authors L. Aguilera, X. Aymerich, M. Nafría, i M. Porti Citation Key 231 COinS Data Date Published 2005 Pagination 1390-1393 Journal Microelectronics Reliability Volume 45 Year of Publication 2005 ← DC BD MOSFET model for circuit reliability simulation → C-AFM Characterization of the Dependence of HfAlOx Electrical Behavior on Post Deposition Annealing Temperature