Authors M. Porti, B. Ebersberger, A. Olbrich, X. Aymerich, M. Nafría, i X. Blasco Citation Key 254 COinS Data Date Published 2001 Pagination 164-167 Journal Nanotechnology Volume 12 Year of Publication 2001 ← Feasibility of the electrical characterization of single SiO2 breakdown spots using C-AFM → Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope