Authors E. Amat, E. Simoen, P. Verheyen, X. Aymerich, M. Nafría, R. Rodríguez, M B González, i J. Martín-Martínez Citation Key 149 COinS Data Journal Journal of Vacuum Science & Technology B (accepted) Year of Publication 2011 → Gate voltage influence on the Channel Hot-Carrier degradation of high-k based devices