Accession Number
11341163
Authors
A. Crespo-Yepes, X. Aymerich, M. Nafría, R. Rodríguez, A. Rothschild, i J. Martín-Martínez
Citation Key
161
COinS Data

Date Published
2010
DOI
10.1109/LED.2010.2045732
ISSN
0741-3106
Keywords
CMOS circuits, DB reversibility, dielectric breakdown (DB), high-$k$, resistive switching
Issue
6
Pagination
543-545
Journal
IEEE Electron Device Letters
Start Page
543
Type of Article
Article; Proceedings Paper
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5451150
Volume
31
Year of Publication
2010