Authors J. Suñé, X. Aymerich, i M. Nafría Citation Key 286 COinS Data Date Published 1993 Issue 7 Pagination 1031-1039 Journal Microelectronics and Reliability Volume 33 Year of Publication 1993 ← Characterization of SiO2 dielectric breakdown for reliability simulation → The statistical distribution of breakdown from multiple breakdown events in one sample