Accession Number
WOS:000270611700019
Authors
A. Crespo-Yepes, X. Aymerich, M. Nafría, R. Rodríguez, i J. Martín-Martínez
Citation Key
168
COinS Data

Date Published
2009
DOI
10.1016/j.microrel.2009.06.029
ISSN
0026-2714
Keywords
OXIDE BREAKDOWN; GATE OXIDE; WEAR-OUT; RELIABILITY
Issue
9-11
Pagination
1024-1028
Journal
Microelectronics Reliability
Start Page
1024
Type of Article
Article
URL
http://www.sciencedirect.com/science/article/pii/S0026271409002029
Volume
49
Year of Publication
2009