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- Accession Number
- WOS:000270611700019
- Authors
- A. Crespo-Yepes, X. Aymerich, M. Nafría, R. Rodríguez, i J. Martín-Martínez
- Citation Key
- 168
- COinS Data
- Date Published
- 2009
- DOI
- 10.1016/j.microrel.2009.06.029
- ISSN
- 0026-2714
- Keywords
- OXIDE BREAKDOWN; GATE OXIDE; WEAR-OUT; RELIABILITY
- Issue
- 9-11
- Pagination
- 1024-1028
- Journal
- Microelectronics Reliability
- Start Page
- 1024
- Type of Article
- Article
- URL
- http://www.sciencedirect.com/science/article/pii/S0026271409002029
- Volume
- 49
- Year of Publication
- 2009