Authors E. Miranda, X. Aymerich, M. Nafría, R. Rodríguez, i J. Suñé Citation Key 272 COinS Data Date Published 1998 Pagination 490-492 Journal Applied Physics Letters Volume 73 (4) Year of Publication 1998 ← Model-independent determination of the degradation dynamics of thin SiO2 films → Trapped charge distributions in thin (10nm) SiO2 films subjected to static and dynamic stresses