Soft breakdown in ultrathin SiO2 layers: the conduction problem from a new point of view

Authors

E. Miranda, X. Aymerich, F. Martín, M. Nafría, R. Rodríguez, i J. Suñé

Citation Key

266

COinS Data

Date Published

1999

Issue

1

Pagination

2223-2226

Journal

Japanese Journal of Applied Physics

Volume

38

Year of Publication

1999